Patent Ranking in Japan - Applicant details - Japanese version

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Shimadzu Corporation

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  2013 Application Ranking      104th  publications: 467 下降2012: 97th  479)

  2013 Acquisition Ranking      83th  registrations: 474 下降2012: 74th  511)

(update:Nov 25, 2021)

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公報番号発明の名称公報発行日備考
特許 5375232 X-ray irradiation device and its safety mechanism Dec 25, 2013
特許 5375968 Radiation detector Dec 25, 2013
特許 5375732 Method for forming barrier film and CVD apparatus used for forming barrier film Dec 25, 2013
特許 5375411 Chromatograph mass spectrometry data analysis method and device Dec 25, 2013
特許 5375655 Radiography device Dec 25, 2013
特許 5375772 Material testing machine shaft center adjustment device Dec 25, 2013
特許 5375299 Analysis condition selection support device and analysis condition selection support method Dec 25, 2013
特許 5375771 Material testing machine shaft center adjustment device Dec 25, 2013
特許 5370497 Holder and optical biometric device using the same Dec 18, 2013
特許 5370475 Photobiological measurement device and analysis method Dec 18, 2013
特許 5370310 Feed pump Dec 18, 2013
特許 5369558 Gas chromatograph Dec 18, 2013
特許 5369400 Flow control valve Dec 18, 2013
特許 5369591 Turbo molecular pump Dec 18, 2013
特許 5370828 TFT array inspection apparatus and TFT substrate alignment method Dec 18, 2013

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5375232 5375968 5375732 5375411 5375655 5375772 5375299 5375771 5370497 5370475 5370310 5369558 5369400 5369591 5370828

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Patent Ranking in Japan

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特許事務所紹介 IP Force 特許事務所紹介

松嶋知的財産事務所

神奈川県横浜市港北区日吉本町1-4-5パレスMR201号 特許・実用新案 意匠 商標 外国特許 訴訟 鑑定 コンサルティング 

角田特許事務所

〒130-0022 東京都墨田区江東橋4-24-5 協新ビル402 特許・実用新案 意匠 商標 外国特許 外国意匠 外国商標 訴訟 鑑定 コンサルティング 

あいだ特許事務所

〒195-0074 東京都町田市山崎町1089-10 特許・実用新案 意匠 商標 外国特許 外国意匠 外国商標 鑑定 コンサルティング