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Samsung Electronics Co., Ltd.
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■ 2014 Application Ranking 64th publications: 609
（
2013: 61th 707）
■ 2014 Acquisition Ranking 80th registrations: 474
（2013: 55th 679）
（update：Mar 29, 2023）
Samsung Electronics Co., Ltd.の商標一覧| 公報番号 | 発明の名称 | 公報発行日 | 備考 |
|---|---|---|---|
| 特開 2014-241135 | Communication method of node in content-centric network and node | Dec 25, 2014 | 共同出願 |
| 特開 2014-241498 | Program recommendation device | Dec 25, 2014 | |
| 特開 2014-238962 | Electron beam equipment | Dec 18, 2014 | |
| 特開 2014-238982 | Electron beam inspection apparatus and electron beam inspection method | Dec 18, 2014 | |
| 特開 2014-239638 | Wireless power transmitter | Dec 18, 2014 | 共同出願 |
| 特開 2014-235883 | Electron beam equipment | Dec 15, 2014 | |
| 特開 2014-236516 | Interference control method in multi-hop network, and relay node and destination node using the interference control method | Dec 15, 2014 | |
| 特開 2014-235676 | Two-dimensional color code display device, display method thereof, two-dimensional color code reading device, and reading method thereof | Dec 15, 2014 | |
| 特開 2014-236021 | Semiconductor chip joining apparatus and semiconductor chip joining method | Dec 15, 2014 | |
| 特開 2014-235746 | Multi-core device and job scheduling method for multi-core device | Dec 15, 2014 | 共同出願 |
| 特開 2014-236218 | Light emitting device and liquid crystal display including the same | Dec 15, 2014 | |
| 特開 2014-232323 | Curved display device | Dec 11, 2014 | |
| 特開 2014-232485 | Texture detection device, texture detection method, texture detection program, and image processing system | Dec 11, 2014 | |
| 特開 2014-232875 | Method for manufacturing semiconductor device having through electrode | Dec 11, 2014 | |
| 特開 2014-229302 | How to execute the function of the electronic device and the electronic device | Dec 8, 2014 |
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2014-241135 2014-241498 2014-238962 2014-238982 2014-239638 2014-235883 2014-236516 2014-235676 2014-236021 2014-235746 2014-236218 2014-232323 2014-232485 2014-232875 2014-229302
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Patent Ranking in Japan
特許事務所紹介 IP Force 特許事務所紹介
〒330-0846 埼玉県さいたま市大宮区大門町3-205 ＡＢＣビル401 特許・実用新案 意匠 商標 外国特許 外国意匠 外国商標 訴訟 鑑定 コンサルティング
京都市伏見区深草大亀谷万帖敷町４４６－２ 特許・実用新案 意匠 商標 外国特許 外国意匠 外国商標 訴訟 鑑定 コンサルティング
茨城県牛久市ひたち野東4丁目３－２ 特許・実用新案 意匠 商標 外国特許 外国意匠 外国商標 訴訟 鑑定 コンサルティング
