Patent Ranking in Japan - Applicant details - Japanese version

ホーム > Japan Patent Ranking > Nikon Corporation > 2011 > Patents

Nikon Corporation

※ You can add "Nikon Corporation" to your own list by loggin in. About Login

  2011 Application Ranking      23th  publications: 1776 下降2010: 20th  2330)

  2011 Acquisition Ranking      36th  registrations: 814 上昇2010: 37th  656)

(update:Dec 3, 2020)

2012  2013  2014  2015  2016  2017  2018  2019  2020 

公報番号発明の名称公報発行日備考
特許 4844157 Scanning microscope Dec 28, 2011
特許 4844177 Image stabilizer and camera Dec 28, 2011
特許 4848770 Polishing pad surface shape measuring device, polishing pad surface shape measuring device usage method, polishing pad cone apex angle measuring method, polishing pad groove depth measuring method, CMP polishing device, and semiconductor device manufacturing method Dec 28, 2011
特許 4844137 Microscope equipment Dec 28, 2011
特許 4844135 Vibration actuator device, lens barrel and camera system Dec 28, 2011
特許 4848965 Imaging device Dec 28, 2011
特許 4844835 Correction method and exposure apparatus Dec 28, 2011
特許 4848837 Exposure method and exposure apparatus for comb-shaped electrode Dec 28, 2011
特許 4844398 Illumination apparatus, exposure apparatus, and microdevice manufacturing method Dec 28, 2011
特許 4844868 Polishing apparatus and semiconductor device manufacturing method using the same Dec 28, 2011
特許 4848956 Exposure apparatus, exposure method, and device manufacturing method Dec 28, 2011
特許 4844312 Lens barrel, optical equipment Dec 28, 2011
特許 4844123 Exposure apparatus and device manufacturing method Dec 28, 2011
特許 4848748 Imaging device Dec 28, 2011
特許 4844862 Grating illumination microscope Dec 28, 2011

1-15 (total:814)

1 2 3 4 5 6 7next>

: select publication number

Copy all numbers

4844157 4844177 4848770 4844137 4844135 4848965 4844835 4848837 4844398 4844868 4848956 4844312 4844123 4848748 4844862

※ You can add applicants to the list by logging in. Useful for checking trends in "Nikon Corporation" intellectual property.

About Login

  • このサイトをYahoo!ブックマークに登録
  • はてなブックマークに追加

Patent Ranking in Japan

2020 Application Ranking2020 Acquisition Ranking
2019 Application Ranking2019 Acquisition Ranking
2018 Application Ranking2018 Acquisition Ranking
2017 Application Ranking2017 Acquisition Ranking
2016 Application Ranking2016 Acquisition Ranking
2015 Application Ranking2015 Acquisition Ranking
2014 Application Ranking2014 Acquisition Ranking
2013 Application Ranking2013 Acquisition Ranking
2012 Application Ranking2012 Acquisition Ranking
Applicant Search (Japanese only)

今週の知財セミナー (12月7日~12月13日)

来週の知財セミナー (12月14日~12月20日)

特許事務所紹介 IP Force 特許事務所紹介

あいぎ法律事務所

〒450-0002 愛知県名古屋市中村区名駅三丁目13番24号 第一はせ川ビル6階 特許・実用新案 意匠 商標 訴訟 鑑定 コンサルティング 

あいわ特許業務法人(特許事務所)

〒104-0045 東京都中央区築地1-12-22 コンワビル4F 特許・実用新案 意匠 商標 外国特許 外国意匠 外国商標 訴訟 鑑定 コンサルティング 

特許業務法人 湘洋内外特許事務所

〒220-0004 横浜市西区北幸2-15-1 東武横浜第2ビル6階 特許・実用新案 意匠 商標 外国特許 外国意匠 外国商標 訴訟 鑑定 コンサルティング