Patent Ranking in Japan - Applicant details - Japanese version

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New Flare Technology Co., Ltd.

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  2017 Application Ranking      450th  publications: 88 下降2016: 354th  106)

  2017 Acquisition Ranking      453th  registrations: 58 上昇2016: 493th  56)

(update:Sep 27, 2021)

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Publication numberTitle of the InventionPublic. dateRemarks
A 2017-228650 Charged particle beam drawing apparatus and charged particle beam drawing method Dec 28, 2017
A 2017-228702 Heat transfer plate and drawing device Dec 28, 2017
A 2017-219355 Inspection method Dec 14, 2017
A 2017-220491 Multi-charged particle beam exposure method and multi-charged particle beam exposure apparatus Dec 14, 2017
A 2017-220497 Inspection method Dec 14, 2017
A 2017-220615 Multi charged particle beam drawing apparatus and adjusting method thereof Dec 14, 2017
A 2017-216338 Blanking device for multi-charged particle beam and multi-charged particle beam irradiation device Dec 7, 2017
A 2017-216392 Pattern inspection device and pattern inspection method Dec 7, 2017
A 2017-211392 Pattern evaluation method and pattern evaluation apparatus Nov 30, 2017
A 2017-198587 Pattern inspection equipment Nov 2, 2017
A 2017-198588 Pattern inspection equipment Nov 2, 2017
A 2017-198589 Pattern inspection method and pattern inspection apparatus Nov 2, 2017
A 2017-198607 Pattern defect inspection method and pattern defect inspection apparatus Nov 2, 2017
A 2017-199610 Stage mechanism Nov 2, 2017
A 2017-199758 Multi-charged particle beam irradiation device, multi-charged particle beam irradiation method, and multi-charged particle beam adjustment method Nov 2, 2017

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2017-228650 2017-228702 2017-219355 2017-220491 2017-220497 2017-220615 2017-216338 2017-216392 2017-211392 2017-198587 2017-198588 2017-198589 2017-198607 2017-199610 2017-199758

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