Patent Ranking in Japan - Applicant details - Japanese version

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Hitachi High-Technologies Corporation

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  2011 Application Ranking      52th  publications: 689 上昇2010: 70th  624)

  2011 Acquisition Ranking      98th  registrations: 350 下降2010: 95th  307)

(update:Oct 22, 2020)

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公報番号発明の名称公報発行日備考
特許 4847711 Charged particle beam device Dec 28, 2011
特許 4845452 Sample observation method and charged particle beam device Dec 28, 2011
特許 4847848 Method for detecting molecule bound to carrier protein, detection kit and detection device Dec 28, 2011
特許 4845903 Work handling device and component mounting device Dec 28, 2011
特許 4845816 Plasma processing device Dec 28, 2011
特許 4847685 Pattern search method Dec 28, 2011
特許 4847900 Scanning electron microscope Dec 28, 2011
特許 4848310 Microscope with probe and method for driving probe Dec 28, 2011
特許 4843399 Inspection device and inspection method Dec 21, 2011
特許 4843406 Capillary electrophoresis analyzer Dec 21, 2011
特許 4839276 Liquid chromatograph mass spectrometer Dec 21, 2011
特許 4843413 Electron beam inspection apparatus and electron beam inspection method Dec 21, 2011
特許 4843250 Method of identifying substances using mass spectrometry Dec 21, 2011
特許 4842533 Defect inspection equipment Dec 21, 2011
特許 4839254 Mass spectrometry data analysis method Dec 21, 2011

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4847711 4845452 4847848 4845903 4845816 4847685 4847900 4848310 4843399 4843406 4839276 4843413 4843250 4842533 4839254

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特許事務所紹介 IP Force 特許事務所紹介

ウェストルム特許商標事務所

〒460-0008 愛知県名古屋市中区栄一丁目23番29号 伏見ポイントビル3F 特許・実用新案 意匠 商標 外国特許 外国商標 鑑定 コンサルティング 

特許業務法人 IPX

東京都港区北青山2丁目7番20号 第二猪瀬ビル3F 特許・実用新案 意匠 商標 外国特許 外国意匠 外国商標 訴訟 鑑定 コンサルティング 

名嶋・山本・綿貫特許事務所

〒450-0002 愛知県名古屋市中村区名駅4丁目2-25 名古屋ビル東館9階 特許・実用新案 意匠 商標 外国特許 外国意匠 外国商標 訴訟 鑑定 コンサルティング