Patent Ranking in Japan - Applicant details - Japanese version

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Hitachi High-Technologies Corporation

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  2011 Application Ranking      52th  publications: 689 上昇2010: 70th  624)

  2011 Acquisition Ranking      98th  registrations: 350 下降2010: 95th  307)

(update:Feb 25, 2021)

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公報番号発明の名称公報発行日備考
特開 2011-258563 Mass spectrometer Dec 22, 2011
特開 2011-257224 Nucleic acid analysis device and manufacturing method thereof Dec 22, 2011
特開 2011-254806 Fishing device and fishing method Dec 22, 2011
特開 2011-257222 Defect inspection method and defect inspection apparatus Dec 22, 2011
特開 2011-258576 Standard sample used in charged particle beam apparatus, charged particle beam apparatus, and method for manufacturing standard sample used in charged particle beam apparatus Dec 22, 2011
特開 2011-258573 Charged particle beam device Dec 22, 2011
特開 2011-257304 Substrate inspection method and device Dec 22, 2011
特開 2011-257186 Defect inspection equipment Dec 22, 2011
特開 2011-257268 Spectrophotometer Dec 22, 2011
特開 2011-258615 Plasma processing apparatus and plasma processing method Dec 22, 2011
特開 2011-254944 Magnetic field analysis method, program, and magnetic field analysis device Dec 22, 2011
特開 2011-257427 Automatic analyzer Dec 22, 2011
特開 2011-258967 Plasma processing device Dec 22, 2011
特開 2011-258614 Plasma processing device or sample mounting table Dec 22, 2011
特開 2011-257408 Displacement detection circuit Dec 22, 2011

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2011-258563 2011-257224 2011-254806 2011-257222 2011-258576 2011-258573 2011-257304 2011-257186 2011-257268 2011-258615 2011-254944 2011-257427 2011-258967 2011-258614 2011-257408

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あいぎ特許事務所【名古屋・岐阜】

名古屋本部オフィス 〒450-0002 愛知県名古屋市中村区名駅3-13-24 第一はせ川ビル6F http://aigipat.com/ 岐阜オフィス 〒509-0124 岐阜県各務原市鵜沼山崎町3丁目146番地1 PACビル2階(旧横山ビル) http://gifu.aigipat.com/ 特許・実用新案 意匠 商標 外国特許 外国意匠 外国商標 訴訟 鑑定 コンサルティング 

辰己国際特許事務所 (TATSUMI International IP Firm)

〒340-0051 埼玉県草加市長栄2-12-12 特許・実用新案 商標 外国特許 外国商標 コンサルティング 

彩都総合特許事務所 新潟オフィス

新潟県新潟市東区新松崎3-22-15 ラフィネドミールⅡ-102 特許・実用新案 意匠 商標 訴訟