Patent Ranking in Japan - Applicant details - Japanese version

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Hitachi High-Technologies Corporation

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  2014 Application Ranking      59th  publications: 659 変わらず2013: 59th  716)

  2014 Acquisition Ranking      54th  registrations: 625 下降2013: 51th  717)

(update:Jan 28, 2021)

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公報番号発明の名称公報発行日備考
特開 2014-240765 Line pattern shape evaluation method and its equipment Dec 25, 2014
特開 2014-241301 Charged particle beam device and its control method Dec 25, 2014
特開 2014-240801 Infrared inspection device Dec 25, 2014
特開 2014-239060 Sample observation method Dec 18, 2014
特開 2014-239091 Plasma processing equipment and plasma processing method Dec 18, 2014
特開 2014-239063 Charged particle beam device Dec 18, 2014
特開 2014-238346 Automatic analyzer Dec 18, 2014
特開 2014-235253 Pattern forming device and pattern forming method Dec 15, 2014
特開 2014-235035 Liquid chromatograph analyzer, analysis system and analysis method using it Dec 15, 2014
特開 2014-235076 Blood cell destruction reagent and blood cell destruction method using it Dec 15, 2014
特開 2014-235948 Ion source and ion milling device Dec 15, 2014
特開 2014-235001 Automatic analyzer Dec 15, 2014
特開 2014-235020 Automatic analyzer Dec 15, 2014
特開 2014-235985 Charged particle beam device Dec 15, 2014
特開 2014-232057 Temperature control unit and nucleic acid analyzer using it Dec 11, 2014

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2014-240765 2014-241301 2014-240801 2014-239060 2014-239091 2014-239063 2014-238346 2014-235253 2014-235035 2014-235076 2014-235948 2014-235001 2014-235020 2014-235985 2014-232057

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Patent Ranking in Japan

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〒060-0002 札幌市中央区北2条西3丁目1番地太陽生命札幌ビル7階 特許・実用新案 商標 外国特許 訴訟 鑑定 コンサルティング 

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大阪府大阪市北区西天満3丁目5-10 オフィスポート大阪801号 特許・実用新案 意匠 商標 訴訟 コンサルティング 

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〒450-0002 愛知県名古屋市中村区名駅三丁目13番24号 第一はせ川ビル6階 特許・実用新案 意匠 商標 訴訟 鑑定 コンサルティング