Patent Ranking in Japan - Applicant details - Japanese version

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Renesas Electronics Corporation

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  2012 Application Ranking      29th  publications: 1347 下降2011: 22th  1823)

  2012 Acquisition Ranking      28th  registrations: 1067 下降2011: 26th  1109)

(update:Nov 26, 2020)

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公報番号発明の名称公報発行日備考
特開 2012-253836 Voltage monitoring system and voltage monitoring module Dec 20, 2012
特開 2012-252749 Optical disc recording device, recorded data transmission method and semiconductor device Dec 20, 2012
特開 2012-251970 Semiconductor integrated circuit equipment test method and test board Dec 20, 2012
特開 2012-253502 Semiconductor device Dec 20, 2012
特開 2012-251861 Electronic flow meter Dec 20, 2012
特開 2012-253235 Semiconductor devices and their manufacturing methods Dec 20, 2012
特開 2012-252735 Optical disc device and semiconductor device Dec 20, 2012
特開 2012-252490 Multiprocessor and image processing system using it Dec 20, 2012
特開 2012-252373 Self-diagnosis device, self-diagnosis method, and program Dec 20, 2012
特開 2012-252216 Panel display device data driver Dec 20, 2012
特開 2012-252141 Semiconductor processing equipment Dec 20, 2012
特開 2012-251772 Inspection methods for semiconductor devices, electronic devices, and semiconductor devices Dec 20, 2012
特開 2012-252731 Semiconductor device Dec 20, 2012
特開 2012-252567 Data processing system Dec 20, 2012
特開 2012-253597 Voltage detection circuit Dec 20, 2012

31-45 (total:1347)

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2012-253836 2012-252749 2012-251970 2012-253502 2012-251861 2012-253235 2012-252735 2012-252490 2012-252373 2012-252216 2012-252141 2012-251772 2012-252731 2012-252567 2012-253597

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ウェストルム特許商標事務所

〒460-0008 愛知県名古屋市中区栄一丁目23番29号 伏見ポイントビル3F 特許・実用新案 意匠 商標 外国特許 外国商標 鑑定 コンサルティング 

辰己国際特許事務所 (TATSUMI International IP Firm)

〒340-0051 埼玉県草加市長栄2-12-12 特許・実用新案 商標 外国特許 外国商標 コンサルティング 

あいぎ特許事務所【名古屋・岐阜】

名古屋本部オフィス 〒450-0002 愛知県名古屋市中村区名駅3-13-24 第一はせ川ビル6F http://aigipat.com/ 岐阜オフィス 〒509-0124 岐阜県各務原市鵜沼山崎町3丁目146番地1 PACビル2階(旧横山ビル) http://gifu.aigipat.com/ 特許・実用新案 意匠 商標 外国特許 外国意匠 外国商標 訴訟 鑑定 コンサルティング